Last edited by Brataur
Monday, July 20, 2020 | History

2 edition of New technology challenges metrology found in the catalog.

New technology challenges metrology

Judson C. French

New technology challenges metrology

presented at the Interamerican Metrology Conference, marking the formal establishment of the Interamerican Metrology System, held in Buenos Aires, September 4-7, 1979

by Judson C. French

  • 239 Want to read
  • 36 Currently reading

Published by U.S. Government Printing Office in Washington, D.C .
Written in English


Edition Notes

Statementsponsored by the Argentine National Institute of Industrial Technology.
SeriesSpecial publications / National Bureau of Standards -- 611, Special publications -- 611.
ContributionsArgentine National Institute of Industrial Technology., Interamerican Metrology Conference (1979 : Buenos Aires)
ID Numbers
Open LibraryOL18850948M

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